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Coincident detection approach based on scale-invariance characteristic of scattering locations in wavelet-based range-scale domain
journal contributionposted on 2023-05-16, 11:30 authored by Le, TT, Nguyen, T
A coincident detection approach based on the scale-invariance characteristic of scattering locations in the range-scale domain of the wavelet transform for stepped-frequency backscattered data is presented. It is an efficient and robust approach for the extraction of scattering centres in multi-resolution range profiles.
Publication titleElectronics Letters
Department/SchoolSchool of Engineering
PublisherThe Institution of Electrical Engineers
Place of publicationUK